Committees > TPC committee
Technical Program Committee
Technical Program Chairs |
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Hélène FREMONT |
IMS, University of Bordeaux (France) |
Nathalie LABAT |
IMS, University of Bordeaux (France) |
François MARC |
IMS, University of Bordeaux (France) |
Nicolas NOLHIER |
LAAS-CNRS, University of Toulouse (France) |
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Sub-committee Chairs |
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Topic A: Quality and Reliability assessment techniques and methods for Devices and Systems
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Edgar OLTHOF |
NXP (The Netherland) |
Cora SALM |
University of Twente (The Netherlands) |
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Topic B: Semiconductor Failure Mechanisms & Reliability for Si technologies & Nanoelectronics
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Alain BRAVAIX |
IM2PN-CNRS, ISEN (France) |
Eckhard LANGER |
Globalfoundries (Germany) |
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Topic C: Progress in Failure Analysis: Defect Detection and Analysis
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Frank ALTMANN |
Fraunhofer IMWS (Germany) |
Giovanna MURA |
University of Cagliari (Italy) |
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Topic D: Reliability of Microwave devices and circuits
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Michael DAMMANN |
Fraunhofer IAF (Germany) |
Jean-Guy TARTARIN |
LAAS-CNRS, University of Toulouse (France) |
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Topic E: Packaging and Assembly Reliability and Failure Analysis
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Alexandrine GUÉDON-GRACIA |
IMS, University of Bordeaux (France) |
Julien PERRAUD |
THALES (France) |
René RONGEN |
NXP (The Netherlands) |
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F : Power Devices and Microelectronic System: Reliability and Failure Analysis |
Topic F1: Smart-power devices, IGBT, Thyristors
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Mauro CIAPPA |
ETH Zurich (Switzerland) |
Chiara CORVASCE |
Hitachi ABB Power Grids (Switzerland) |
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Topic F2: SiC and GaN power devices
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Matteo MENEGHINI |
University of Padova (Italy) |
Loic THEOLIER |
IMS, University of Bordeaux (France) |
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Topic F3: Power Electronic System reliability
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Olivier CREPEL |
AIRBUS (France) |
Francesco IANNUZZO |
University of Aalborg (Denmark) |
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Topic G: Photonics Reliability
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Alain BENSOUSSAN |
Thales Alenia Space (France) |
Massimo VANZI |
University of Cagliari (Italy) |
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Topic H: MEMS and sensors Reliability
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Fabio COCCETTI |
IRT Saint Exupéry (France) |
Stefan OBERHOFF |
Robert Bosch GmbH (Germany) |
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Topic I : Extreme environments and Radiation |
Fabrice CAIGNET |
LAAS-CNRS, University of Toulouse (France) |
Tristan DUBOIS |
IMS, University of Bordeaux (France) |
Philippe GALY |
STMicroelectronics (France) |
Maria MAZUREK |
Airbus (France) |
Slawosz UZNANSKI |
CERN (Switzerland) |
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