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Technical Program Committee

 

 

Technical Program Chairs
 
Hélène FREMONT IMS, University of Bordeaux (France)
Nathalie LABAT IMS, University of Bordeaux (France)
François MARC IMS, University of Bordeaux (France)
Nicolas NOLHIER LAAS-CNRS, University of Toulouse (France)
 
Sub-committee Chairs
 
Topic A: Quality and Reliability assessment techniques and methods for Devices and Systems
Edgar OLTHOF NXP (The Netherland)
Cora SALM University of Twente (The Netherlands)
 
Topic B: Semiconductor Failure Mechanisms & Reliability for Si technologies & Nanoelectronics
Alain BRAVAIX IM2PN-CNRS, ISEN (France)
Eckhard LANGER Globalfoundries (Germany)
 
Topic C: Progress in Failure Analysis: Defect Detection and Analysis
Frank ALTMANN Fraunhofer IMWS (Germany)
Giovanna MURA University of Cagliari (Italy)
 
Topic D: Reliability of Microwave devices and circuits
Michael DAMMANN Fraunhofer IAF (Germany)
Jean-Guy TARTARIN LAAS-CNRS, University of Toulouse (France)
 
Topic E: Packaging and Assembly Reliability and Failure Analysis
Alexandrine GUÉDON-GRACIA IMS, University of Bordeaux (France)
Julien PERRAUD THALES (France)
René RONGEN NXP (The Netherlands)
 
F : Power Devices and Microelectronic System: Reliability and Failure Analysis
Topic F1: Smart-power devices, IGBT, Thyristors
Mauro CIAPPA ETH Zurich (Switzerland)
Chiara CORVASCE Hitachi ABB Power Grids (Switzerland)
 
Topic F2: SiC and GaN power devices
Matteo MENEGHINI University of Padova (Italy)
Loic THEOLIER IMS, University of Bordeaux (France)
 
Topic F3: Power Electronic System reliability
Olivier CREPEL AIRBUS (France)
Francesco IANNUZZO University of Aalborg (Denmark)
 
Topic G: Photonics Reliability
Alain BENSOUSSAN Thales Alenia Space (France)
Massimo VANZI University of Cagliari (Italy)
 
Topic H: MEMS and sensors Reliability
Fabio COCCETTI IRT Saint Exupéry   (France)
Stefan OBERHOFF Robert Bosch GmbH (Germany)
 
Topic I : Extreme environments and Radiation
Fabrice CAIGNET LAAS-CNRS, University of Toulouse (France)
Tristan DUBOIS IMS, University of Bordeaux (France)
Philippe GALY STMicroelectronics (France)
Maria MAZUREK Airbus (France)
Slawosz UZNANSKI CERN (Switzerland)

 

 

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